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Nuclear Event Detectors Overview
Maxwell Technologies Microelectronics' Nuclear
Event Detectors (NEDs) provide a simple, small, reliable, and convenient
method for:
- detecting ionizing radiation pulses
- controlling hardware to prevent upset and permanent damage
- initiating both hardware and software recovery from the event
- providing all of these benefits, and more, in a package outline
of less than 0.5” x 0.8”
The proper
incorporation of this product into a circuit or system design provides
a cost-effective means to achieve the required levels of nuclear
hardness for the prompt ionizing radiation environment.
Nuclear
Event Detector
Maxwell Technologies' NEDs provide four primary functions:
- prompt ionizing radiation detector,
- a monostable pulse generator,
- a bi-stable logic latch, and
- built-in test (BIT).
Nuclear Event Detector Product Line
Four models of NEDs are available
to suit a variety of different needs and levels of screening requirements.
| Product |
Description |
| HSN-3000 |
Guaranteed Radiation Hardness (100% screen)
with Nuclear Event Flag (NEF) Signal
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| HSN-2000 |
Designed-In Radiation Hardness (10% screen) with Nuclear Event
Flag (NEF) Signal |
| HSN-1000 |
Guaranteed Radiation Hardness (100% screen) |
| HSN-500 |
Designed-In Radiation Hardness (10% screen) |
If you have questions or comments
about these products, please contact
us.
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